Izzat Bakhadyrov, Mohsen A. Jafari, Tong Fang, Ahmad Safari, Stephen C. Danforth, Noshir A. Langrana. Defect detection in indirect layered manufacturing. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, SMC 1998, Hyatt Regency La Jolla, San Diego, California, USA, October 11-14,1998. pages 4251-4256, IEEE, 1998. [doi]
@inproceedings{BakhadyrovJFSDL98,
title = {Defect detection in indirect layered manufacturing},
author = {Izzat Bakhadyrov and Mohsen A. Jafari and Tong Fang and Ahmad Safari and Stephen C. Danforth and Noshir A. Langrana},
year = {1998},
doi = {10.1109/ICSMC.1998.727513},
url = {https://doi.org/10.1109/ICSMC.1998.727513},
researchr = {https://researchr.org/publication/BakhadyrovJFSDL98},
cites = {0},
citedby = {0},
pages = {4251-4256},
booktitle = {Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, SMC 1998, Hyatt Regency La Jolla, San Diego, California, USA, October 11-14,1998},
publisher = {IEEE},
isbn = {0-7803-4778-1},
}