Eduard Bakstein, Jakub Schneider, Tomás Sieger, Daniel Novák, Jirí Wild, Robert Jech. Supervised segmentation of microelectrode recording artifacts using power spectral density. In 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015, Milan, Italy, August 25-29, 2015. pages 1524-1527, IEEE, 2015. [doi]
@inproceedings{BaksteinSSNWJ15,
title = {Supervised segmentation of microelectrode recording artifacts using power spectral density},
author = {Eduard Bakstein and Jakub Schneider and Tomás Sieger and Daniel Novák and Jirí Wild and Robert Jech},
year = {2015},
doi = {10.1109/EMBC.2015.7318661},
url = {http://dx.doi.org/10.1109/EMBC.2015.7318661},
researchr = {https://researchr.org/publication/BaksteinSSNWJ15},
cites = {0},
citedby = {0},
pages = {1524-1527},
booktitle = {37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015, Milan, Italy, August 25-29, 2015},
publisher = {IEEE},
isbn = {978-1-4244-9271-8},
}