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Robust Processing of Color Target Measurements for Device Characterization

Raja Bala, Gaurav Sharma, Dennis Venable. Robust Processing of Color Target Measurements for Device Characterization. In PICS 2003: The PICS Conference, An International Technical Conference on The Science and Systems of Digital Photography, including the Fifth International Symposium on Multispectral Color Science, May 13, 2003, Rochester, NY, USA. pages 413-420, IS&T - The Society for Imaging Science and Technology, 2003. [doi]

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Raja Bala

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Gaurav Sharma

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Dennis Venable

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