EM algorithm for one-shot device testing with competing risks under exponential distribution

Narayanaswamy Balakrishnan, H. Y. So, Man Ho Ling. EM algorithm for one-shot device testing with competing risks under exponential distribution. Rel. Eng. & Sys. Safety, 137:129-140, 2015. [doi]

Authors

Narayanaswamy Balakrishnan

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H. Y. So

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Man Ho Ling

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