Uma M. Balasubramani, Kartik Iyer, Balaji Santhana Krishnan, Hema Kovvuri. Bug Bash: An Efficient Approach to Increase Test Coverage and Ensure Product Quality in an Agile Environment. In 2016 IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops 2016, Ottawa, ON, Canada, October 23-27, 2016. pages 29-36, IEEE Computer Society, 2016. [doi]
@inproceedings{BalasubramaniIK16,
title = {Bug Bash: An Efficient Approach to Increase Test Coverage and Ensure Product Quality in an Agile Environment},
author = {Uma M. Balasubramani and Kartik Iyer and Balaji Santhana Krishnan and Hema Kovvuri},
year = {2016},
doi = {10.1109/ISSREW.2016.16},
url = {http://doi.ieeecomputersociety.org/10.1109/ISSREW.2016.16},
researchr = {https://researchr.org/publication/BalasubramaniIK16},
cites = {0},
citedby = {0},
pages = {29-36},
booktitle = {2016 IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops 2016, Ottawa, ON, Canada, October 23-27, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3601-1},
}