Tiago R. Balen, Marcelo Lubaszewski. Radiation effects on programmable analog devices and mitigation techniques. In 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. pages 136, IEEE, 2010. [doi]
@inproceedings{BalenL10,
title = {Radiation effects on programmable analog devices and mitigation techniques},
author = {Tiago R. Balen and Marcelo Lubaszewski},
year = {2010},
doi = {10.1109/IOLTS.2010.5560221},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2010.5560221},
researchr = {https://researchr.org/publication/BalenL10},
cites = {0},
citedby = {0},
pages = {136},
booktitle = {16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece},
publisher = {IEEE},
isbn = {978-1-4244-7724-1},
}