Martin Balfroid, Pierre Luycx, Benoît Vanderose, Xavier Devroey. An Empirical Evaluation of Regular and Extreme Mutation Testing for Teaching Software Testing. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2023 - Workshops, Dublin, Ireland, April 16-20, 2023. pages 405-412, IEEE, 2023. [doi]
@inproceedings{BalfroidLVD23,
title = {An Empirical Evaluation of Regular and Extreme Mutation Testing for Teaching Software Testing},
author = {Martin Balfroid and Pierre Luycx and Benoît Vanderose and Xavier Devroey},
year = {2023},
doi = {10.1109/ICSTW58534.2023.00074},
url = {https://doi.org/10.1109/ICSTW58534.2023.00074},
researchr = {https://researchr.org/publication/BalfroidLVD23},
cites = {0},
citedby = {0},
pages = {405-412},
booktitle = {IEEE International Conference on Software Testing, Verification and Validation, ICST 2023 - Workshops, Dublin, Ireland, April 16-20, 2023},
publisher = {IEEE},
isbn = {979-8-3503-3335-0},
}