Ayan Banerjee, Imane Lamrani, Sandeep K. S. Gupta. FaultEx: Explaining operational changes in terms of design variables in CPS control code. In 4th IEEE International Conference on Industrial Cyber-Physical Systems, ICPS 2021, Victoria, BC, Canada, May 10-12, 2021. pages 485-490, IEEE, 2021. [doi]
@inproceedings{BanerjeeLG21,
title = {FaultEx: Explaining operational changes in terms of design variables in CPS control code},
author = {Ayan Banerjee and Imane Lamrani and Sandeep K. S. Gupta},
year = {2021},
doi = {10.1109/ICPS49255.2021.9468161},
url = {https://doi.org/10.1109/ICPS49255.2021.9468161},
researchr = {https://researchr.org/publication/BanerjeeLG21},
cites = {0},
citedby = {0},
pages = {485-490},
booktitle = {4th IEEE International Conference on Industrial Cyber-Physical Systems, ICPS 2021, Victoria, BC, Canada, May 10-12, 2021},
publisher = {IEEE},
isbn = {978-1-7281-6207-2},
}