ODETTE: A non-scan design-for-test methodology for Trojan detection in ICs

Mainak Banga, Michael S. Hsiao. ODETTE: A non-scan design-for-test methodology for Trojan detection in ICs. In HOST 2011, Proceedings of the 2011 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 5-6 June 2011, San Diego, California, USA. pages 18-23, IEEE Computer Society, 2011. [doi]

@inproceedings{BangaH11,
  title = {ODETTE: A non-scan design-for-test methodology for Trojan detection in ICs},
  author = {Mainak Banga and Michael S. Hsiao},
  year = {2011},
  doi = {10.1109/HST.2011.5954989},
  url = {http://dx.doi.org/10.1109/HST.2011.5954989},
  researchr = {https://researchr.org/publication/BangaH11},
  cites = {0},
  citedby = {0},
  pages = {18-23},
  booktitle = {HOST 2011, Proceedings of the 2011 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 5-6 June 2011, San Diego, California, USA},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4577-1059-9},
}