Critical IEC 61850 MMS Feature Selection for ML-Driven IDS - researchr publication authors

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Kishan Baranwal, Haresh Dagale, Vikas Bishnoi. Critical IEC 61850 MMS Feature Selection for ML-Driven IDS. In Proceedings of the 11th ACM Cyber-Physical System Security Workshop, CPSS 2025, Hanoi, Vietnam, August 25-29, 2025. pages 64-73, ACM, 2025. [doi]

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