Deep Learning Anti-Patterns from Code Metrics History

Antoine Barbez, Foutse Khomh, Yann-Gaël Guéhéneuc. Deep Learning Anti-Patterns from Code Metrics History. In 2019 IEEE International Conference on Software Maintenance and Evolution, ICSME 2019, Cleveland, OH, USA, September 29 - October 4, 2019. pages 114-124, IEEE, 2019. [doi]

Authors

Antoine Barbez

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Foutse Khomh

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Yann-Gaël Guéhéneuc

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