Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas. Functional fault models for non-scan sequential circuits. Microelectronics Reliability, 51(12):2402-2411, 2011. [doi]
@article{BareisaJMS11,
title = {Functional fault models for non-scan sequential circuits},
author = {Eduardas Bareisa and Vacius Jusas and Kestutis Motiejunas and Rimantas Seinauskas},
year = {2011},
doi = {10.1016/j.microrel.2011.07.069},
url = {http://dx.doi.org/10.1016/j.microrel.2011.07.069},
researchr = {https://researchr.org/publication/BareisaJMS11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {12},
pages = {2402-2411},
}