Lee Barford. Sequential Bayesian bit error rate measurement. IEEE T. Instrumentation and Measurement, 53(4):947-954, 2004. [doi]
@article{Barford04,
title = {Sequential Bayesian bit error rate measurement},
author = {Lee Barford},
year = {2004},
doi = {10.1109/TIM.2004.831129},
url = {http://dx.doi.org/10.1109/TIM.2004.831129},
researchr = {https://researchr.org/publication/Barford04},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {53},
number = {4},
pages = {947-954},
}