D. Bari, N. Wrachien, R. Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester. Comparison between positive and negative constant current stress on dye-sensitized solar cells. Microelectronics Reliability, 53(9-11):1804-1808, 2013. [doi]
@article{BariWTBRCMC13,
title = {Comparison between positive and negative constant current stress on dye-sensitized solar cells},
author = {D. Bari and N. Wrachien and R. Tagliaferro and Thomas M. Brown and Andrea Reale and Aldo Di Carlo and Gaudenzio Meneghesso and Andrea Cester},
year = {2013},
doi = {10.1016/j.microrel.2013.07.093},
url = {http://dx.doi.org/10.1016/j.microrel.2013.07.093},
researchr = {https://researchr.org/publication/BariWTBRCMC13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {9-11},
pages = {1804-1808},
}