Oren Barkan, Jonathan Weill, Amir Averbuch. Gaussian process regression for out-of-sample extension. In Francesco A. N. Palmieri, Aurelio Uncini, Kostas I. Diamantaras, Jan Larsen, editors, 26th IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2016, Vietri sul Mare, Salerno, Italy, September 13-16, 2016. pages 1-6, IEEE, 2016. [doi]
@inproceedings{BarkanWA16,
title = {Gaussian process regression for out-of-sample extension},
author = {Oren Barkan and Jonathan Weill and Amir Averbuch},
year = {2016},
doi = {10.1109/MLSP.2016.7738832},
url = {http://dx.doi.org/10.1109/MLSP.2016.7738832},
researchr = {https://researchr.org/publication/BarkanWA16},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {26th IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2016, Vietri sul Mare, Salerno, Italy, September 13-16, 2016},
editor = {Francesco A. N. Palmieri and Aurelio Uncini and Kostas I. Diamantaras and Jan Larsen},
publisher = {IEEE},
isbn = {978-1-5090-0746-2},
}