Thomas S. Barnett, Adit D. Singh, Victor P. Nelson. Extending integrated-circuit yield-models to estimate early-life reliability. IEEE Transactions on Reliability, 52(3):296-300, 2003. [doi]
@article{BarnettSN03,
title = {Extending integrated-circuit yield-models to estimate early-life reliability},
author = {Thomas S. Barnett and Adit D. Singh and Victor P. Nelson},
year = {2003},
doi = {10.1109/TR.2003.816418},
url = {http://dx.doi.org/10.1109/TR.2003.816418},
tags = {reliability},
researchr = {https://researchr.org/publication/BarnettSN03},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {52},
number = {3},
pages = {296-300},
}