A pattern classifier for interval-valued data based on multinomial logistic regression model

Alberto Pereira de Barros, Francisco de Assis TenĂ³rio de Carvalho, Eufrasio de Andrade Lima Neto. A pattern classifier for interval-valued data based on multinomial logistic regression model. In Proceedings of the IEEE International Conference on Systems, Man, and Cybernetics, SMC 2012, Seoul, Korea (South), October 14-17, 2012. pages 541-546, IEEE, 2012. [doi]

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