Philip G. Bartley. Permittivity Measurement of Low-Loss Materials using Embedded Resonance. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022, Ottawa, ON, Canada, May 16-19, 2022. pages 1-5, IEEE, 2022. [doi]
@inproceedings{Bartley22,
title = {Permittivity Measurement of Low-Loss Materials using Embedded Resonance},
author = {Philip G. Bartley},
year = {2022},
doi = {10.1109/I2MTC48687.2022.9806628},
url = {https://doi.org/10.1109/I2MTC48687.2022.9806628},
researchr = {https://researchr.org/publication/Bartley22},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022, Ottawa, ON, Canada, May 16-19, 2022},
publisher = {IEEE},
isbn = {978-1-6654-8360-5},
}