Alessandro Bastari, Matteo Piersantelli, Cristina Cristalli, Nicola Paone. Self-adapting test-plans in production line: An application to vision control stations. In 38th Annual Conference on IEEE Industrial Electronics Society, IECON 2012, Montreal, QC, Canada, October 25-28, 2012. pages 4360-4365, IEEE, 2012. [doi]
@inproceedings{BastariPCP12,
title = {Self-adapting test-plans in production line: An application to vision control stations},
author = {Alessandro Bastari and Matteo Piersantelli and Cristina Cristalli and Nicola Paone},
year = {2012},
doi = {10.1109/IECON.2012.6389187},
url = {https://doi.org/10.1109/IECON.2012.6389187},
researchr = {https://researchr.org/publication/BastariPCP12},
cites = {0},
citedby = {0},
pages = {4360-4365},
booktitle = {38th Annual Conference on IEEE Industrial Electronics Society, IECON 2012, Montreal, QC, Canada, October 25-28, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2419-9},
}