Sanjoy Kumar Basu, Jogesh Chandra Paul, Pramode Ranjan Bhattacharjee. Complete test-set generation for bridging faults in combinational-logic circuits. Inf. Sci., 38(3):257-269, 1986. [doi]
@article{BasuPB86,
title = {Complete test-set generation for bridging faults in combinational-logic circuits},
author = {Sanjoy Kumar Basu and Jogesh Chandra Paul and Pramode Ranjan Bhattacharjee},
year = {1986},
doi = {10.1016/0020-0255(86)90025-3},
url = {http://dx.doi.org/10.1016/0020-0255(86)90025-3},
tags = {completeness, testing, logic},
researchr = {https://researchr.org/publication/BasuPB86},
cites = {0},
citedby = {0},
journal = {Inf. Sci.},
volume = {38},
number = {3},
pages = {257-269},
}