Process Variation and NBTI Tolerant Standard Cells to Improve Parametric Yield and Lifetime of ICs - researchr publication authors

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Shubhankar Basu, Ranga Vemuri. Process Variation and NBTI Tolerant Standard Cells to Improve Parametric Yield and Lifetime of ICs. In 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), May 9-11, 2007, Porto Alegre, Brazil. pages 291-298, IEEE Computer Society, 2007. [doi]

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