Kees Joost Batenburg, Wim van Aarle, Jan Sijbers. A semi-automatic algorithm for grey level estimation in tomography. Pattern Recognition Letters, 32(9):1395-1405, 2011. [doi]
@article{BatenburgAS11,
title = {A semi-automatic algorithm for grey level estimation in tomography},
author = {Kees Joost Batenburg and Wim van Aarle and Jan Sijbers},
year = {2011},
doi = {10.1016/j.patrec.2010.09.001},
url = {http://dx.doi.org/10.1016/j.patrec.2010.09.001},
researchr = {https://researchr.org/publication/BatenburgAS11},
cites = {0},
citedby = {0},
journal = {Pattern Recognition Letters},
volume = {32},
number = {9},
pages = {1395-1405},
}