Ahmet Tugrul Bayrak, Asmin Alev Aktas, Okan Tunali, Orkun Susuz, Nese Abbak. Personalized Customer Churn Analysis with Long Short-Term Memory. In Herwig Unger, Jinho Kim, U Kang, Chakchai So-In, Junping Du, Walid Saad, Young-Guk Ha, Christian Wagner 0002, Julien Bourgeois, Chanboon Sathitwiriyawong, Hyuk-Yoon Kwon, Carson K. Leung, editors, IEEE International Conference on Big Data and Smart Computing, BigComp 2021, Jeju Island, South Korea, January 17-20, 2021. pages 79-82, IEEE, 2021. [doi]
@inproceedings{BayrakATSA21, title = {Personalized Customer Churn Analysis with Long Short-Term Memory}, author = {Ahmet Tugrul Bayrak and Asmin Alev Aktas and Okan Tunali and Orkun Susuz and Nese Abbak}, year = {2021}, doi = {10.1109/BigComp51126.2021.00024}, url = {https://doi.org/10.1109/BigComp51126.2021.00024}, researchr = {https://researchr.org/publication/BayrakATSA21}, cites = {0}, citedby = {0}, pages = {79-82}, booktitle = {IEEE International Conference on Big Data and Smart Computing, BigComp 2021, Jeju Island, South Korea, January 17-20, 2021}, editor = {Herwig Unger and Jinho Kim and U Kang and Chakchai So-In and Junping Du and Walid Saad and Young-Guk Ha and Christian Wagner 0002 and Julien Bourgeois and Chanboon Sathitwiriyawong and Hyuk-Yoon Kwon and Carson K. Leung}, publisher = {IEEE}, isbn = {978-1-7281-8924-6}, }