Low-Cost On-Line Test for Digital Filters

Ismet Bayraktaroglu, Alex Orailoglu. Low-Cost On-Line Test for Digital Filters. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 446-451, IEEE Computer Society, 1999. [doi]

@inproceedings{BayraktarogluO99,
  title = {Low-Cost On-Line Test for Digital Filters},
  author = {Ismet Bayraktaroglu and Alex Orailoglu},
  year = {1999},
  url = {http://csdl.computer.org/comp/proceedings/vts/1999/0146/00/01460446abs.htm},
  tags = {testing},
  researchr = {https://researchr.org/publication/BayraktarogluO99},
  cites = {0},
  citedby = {0},
  pages = {446-451},
  booktitle = {17th  IEEE VLSI Test Symposium (VTS  99), 25-30 April 1999, San Diego, CA, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-0146-X},
}