Reliability tests for discriminating between technological variants of QFN packaging - researchr publication authors

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Marius Bazu, Virgil Emil Ilian, Dragos Varsescu, Lucian Galateanu, Vili Sikio, Meelis Reimets, Volker Uhl, Manuel Weiss. Reliability tests for discriminating between technological variants of QFN packaging. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 226-229, IEEE, 2013. [doi]

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