Thales E. Becker, Alisson J. C. Lanot, Guilherme S. Cardoso, Tiago R. Balen. Single event transient effects on charge redistribution SAR ADCs. Microelectronics Reliability, 73:22-35, 2017. [doi]
@article{BeckerLCB17,
title = {Single event transient effects on charge redistribution SAR ADCs},
author = {Thales E. Becker and Alisson J. C. Lanot and Guilherme S. Cardoso and Tiago R. Balen},
year = {2017},
doi = {10.1016/j.microrel.2017.04.002},
url = {https://doi.org/10.1016/j.microrel.2017.04.002},
researchr = {https://researchr.org/publication/BeckerLCB17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {73},
pages = {22-35},
}