Thales E. Becker, Alisson J. C. Lanot, Guilherme S. Cardoso, Tiago R. Balen. Single event transient effects on charge redistribution SAR ADCs. Microelectronics Reliability, 73:22-35, 2017. [doi]
@article{BeckerLCB17, title = {Single event transient effects on charge redistribution SAR ADCs}, author = {Thales E. Becker and Alisson J. C. Lanot and Guilherme S. Cardoso and Tiago R. Balen}, year = {2017}, doi = {10.1016/j.microrel.2017.04.002}, url = {https://doi.org/10.1016/j.microrel.2017.04.002}, researchr = {https://researchr.org/publication/BeckerLCB17}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {73}, pages = {22-35}, }