A Deep Learning Model to Predict First to Second Year Student Retention - researchr publication authors

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Matthew Beech, Kumar Yelamarthi. A Deep Learning Model to Predict First to Second Year Student Retention. In IEEE International Conference on Electro Information Technology, eIT 2024, Eau Claire, WI, USA, May 30 - June 1, 2024. pages 324-327, IEEE, 2024. [doi]

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