Looking Inside the Wires: Understanding Museum Visitor Learning with an Augmented Circuit Exhibit

Elham Beheshti, David Kim, Gabrielle Ecanow, Michael S. Horn. Looking Inside the Wires: Understanding Museum Visitor Learning with an Augmented Circuit Exhibit. In Gloria Mark, Susan R. Fussell, Cliff Lampe, m. c. schraefel, Juan Pablo Hourcade, Caroline Appert, Daniel Wigdor, editors, Proceedings of the 2017 CHI Conference on Human Factors in Computing Systems, Denver, CO, USA, May 06-11, 2017. pages 1583-1594, ACM, 2017. [doi]

@inproceedings{BeheshtiKEH17,
  title = {Looking Inside the Wires: Understanding Museum Visitor Learning with an Augmented Circuit Exhibit},
  author = {Elham Beheshti and David Kim and Gabrielle Ecanow and Michael S. Horn},
  year = {2017},
  doi = {10.1145/3025453.3025479},
  url = {http://doi.acm.org/10.1145/3025453.3025479},
  researchr = {https://researchr.org/publication/BeheshtiKEH17},
  cites = {0},
  citedby = {0},
  pages = {1583-1594},
  booktitle = {Proceedings of the 2017 CHI Conference on Human Factors in Computing Systems, Denver, CO, USA, May 06-11, 2017},
  editor = {Gloria Mark and Susan R. Fussell and Cliff Lampe and m. c. schraefel and Juan Pablo Hourcade and Caroline Appert and Daniel Wigdor},
  publisher = {ACM},
  isbn = {978-1-4503-4655-9},
}