Sima Behpour, Wei Xing, Brian D. Ziebart. ARC: Adversarial Robust Cuts for Semi-Supervised and Multi-Label Classification. In Sheila A. McIlraith, Kilian Q. Weinberger, editors, Proceedings of the Thirty-Second AAAI Conference on Artificial Intelligence, New Orleans, Louisiana, USA, February 2-7, 2018. pages 2704-2711, AAAI Press, 2018. [doi]
@inproceedings{BehpourXZ18,
title = {ARC: Adversarial Robust Cuts for Semi-Supervised and Multi-Label Classification},
author = {Sima Behpour and Wei Xing and Brian D. Ziebart},
year = {2018},
url = {https://www.aaai.org/ocs/index.php/AAAI/AAAI18/paper/view/17309},
researchr = {https://researchr.org/publication/BehpourXZ18},
cites = {0},
citedby = {0},
pages = {2704-2711},
booktitle = {Proceedings of the Thirty-Second AAAI Conference on Artificial Intelligence, New Orleans, Louisiana, USA, February 2-7, 2018},
editor = {Sheila A. McIlraith and Kilian Q. Weinberger},
publisher = {AAAI Press},
}