Mohamed Ali Belaïd. Performance analysis of S-parameter in N-MOSFET devices after thermal accelerated tests. Microelectronics Reliability, 91:8-14, 2018. [doi]
@article{Belaid18-0,
title = {Performance analysis of S-parameter in N-MOSFET devices after thermal accelerated tests},
author = {Mohamed Ali Belaïd},
year = {2018},
doi = {10.1016/j.microrel.2018.07.133},
url = {https://doi.org/10.1016/j.microrel.2018.07.133},
researchr = {https://researchr.org/publication/Belaid18-0},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {91},
pages = {8-14},
}