Wafer Defect Map Classification Using Sparse Convolutional Networks - researchr publication authors

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Roberto di Bella, Diego Carrera, Beatrice Rossi, Pasqualina Fragneto, Giacomo Boracchi. Wafer Defect Map Classification Using Sparse Convolutional Networks. In Elisa Ricci 0001, Samuel Rota Bulò, Cees Snoek, Oswald Lanz, Stefano Messelodi, Nicu Sebe, editors, Image Analysis and Processing - ICIAP 2019 - 20th International Conference, Trento, Italy, September 9-13, 2019, Proceedings, Part II. Volume 11752 of Lecture Notes in Computer Science, pages 125-136, Springer, 2019. [doi]

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