A. Benoist, S. Denorme, X. Federspiel, Bruno Allard, Philippe Candelier. Extended TDDB power-law validation for high-voltage applications such as OTP memories in High-k CMOS 28nm FDSOI technology. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 3, IEEE, 2015. [doi]
@inproceedings{BenoistDFAC15,
title = {Extended TDDB power-law validation for high-voltage applications such as OTP memories in High-k CMOS 28nm FDSOI technology},
author = {A. Benoist and S. Denorme and X. Federspiel and Bruno Allard and Philippe Candelier},
year = {2015},
doi = {10.1109/IRPS.2015.7112804},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112804},
researchr = {https://researchr.org/publication/BenoistDFAC15},
cites = {0},
citedby = {0},
pages = {3},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}