New techniques for selecting test frequencies for linear analog circuits

Mohand Bentobache, Ahcène Bounceur, Reinhardt Euler, Yann Kieffer, Salvador Mir. New techniques for selecting test frequencies for linear analog circuits. In Martin Margala, Ricardo Augusto da Luz Reis, Alex Orailoglu, Luigi Carro, Luis Miguel Silveira, H. Fatih Ugurdag, editors, 21st IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC 2013, Istanbul, Turkey, October 7-9, 2013. pages 90-95, IEEE, 2013. [doi]

@inproceedings{BentobacheBEKM13-0,
  title = {New techniques for selecting test frequencies for linear analog circuits},
  author = {Mohand Bentobache and Ahcène Bounceur and Reinhardt Euler and Yann Kieffer and Salvador Mir},
  year = {2013},
  doi = {10.1109/VLSI-SoC.2013.6673256},
  url = {http://dx.doi.org/10.1109/VLSI-SoC.2013.6673256},
  researchr = {https://researchr.org/publication/BentobacheBEKM13-0},
  cites = {0},
  citedby = {0},
  pages = {90-95},
  booktitle = {21st IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC 2013, Istanbul, Turkey, October 7-9, 2013},
  editor = {Martin Margala and Ricardo Augusto da Luz Reis and Alex Orailoglu and Luigi Carro and Luis Miguel Silveira and H. Fatih Ugurdag},
  publisher = {IEEE},
  isbn = {978-1-4799-0522-5},
}