Timothy J. Bergfeld, Dirk Niggemeyer, Elizabeth M. Rudnick. Diagnostic Testing of Embedded Memories Using BIST. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 305, IEEE Computer Society, 2000. [doi]
@inproceedings{BergfeldNR00,
title = {Diagnostic Testing of Embedded Memories Using BIST},
author = {Timothy J. Bergfeld and Dirk Niggemeyer and Elizabeth M. Rudnick},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/date/2000/0537/00/05370305abs.htm},
tags = {testing, diagnostics},
researchr = {https://researchr.org/publication/BergfeldNR00},
cites = {0},
citedby = {0},
pages = {305},
booktitle = {2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-0537-6},
}