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Programmer-Guided Reliability for Extreme-Scale Applications

David E. Bernholdt, Wael R. Elwasif, Christos Kartsaklis, Seyong Lee, Tiffany M. Mintz. Programmer-Guided Reliability for Extreme-Scale Applications. In 2015 IEEE International Conference on Cluster Computing, CLUSTER 2015, Chicago, IL, USA, September 8-11, 2015. pages 571-579, IEEE Computer Society, 2015. [doi]

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David E. Bernholdt

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Wael R. Elwasif

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Christos Kartsaklis

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Seyong Lee

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Tiffany M. Mintz

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