Joseph B. Bernstein, Alain Bensoussan, Emmanuel Bender. Reliability prediction with MTOL. Microelectronics Reliability, 68:91-97, 2017. [doi]
@article{BernsteinBB17,
title = {Reliability prediction with MTOL},
author = {Joseph B. Bernstein and Alain Bensoussan and Emmanuel Bender},
year = {2017},
doi = {10.1016/j.microrel.2016.09.005},
url = {http://dx.doi.org/10.1016/j.microrel.2016.09.005},
researchr = {https://researchr.org/publication/BernsteinBB17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {68},
pages = {91-97},
}