Applying Data Mining Techniques to Wafer Manufacturing

Elisa Bertino, Barbara Catania, Eleonora Caglio. Applying Data Mining Techniques to Wafer Manufacturing. In Jan M. Zytkow, Jan Rauch, editors, Principles of Data Mining and Knowledge Discovery, Third European Conference, PKDD 99, Prague, Czech Republic, September 15-18, 1999, Proceedings. Volume 1704 of Lecture Notes in Computer Science, pages 41-50, Springer, 1999.

@inproceedings{BertinoCC99:0,
  title = {Applying Data Mining Techniques to Wafer Manufacturing},
  author = {Elisa Bertino and Barbara Catania and Eleonora Caglio},
  year = {1999},
  tags = {data-flow},
  researchr = {https://researchr.org/publication/BertinoCC99%3A0},
  cites = {0},
  citedby = {0},
  pages = {41-50},
  booktitle = {Principles of Data Mining and Knowledge Discovery, Third European Conference, PKDD  99, Prague, Czech Republic, September 15-18, 1999, Proceedings},
  editor = {Jan M. Zytkow and Jan Rauch},
  volume = {1704},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {3-540-66490-4},
}