Skin Deep Unlearning: Artefact and Instrument Debiasing in the Context of Melanoma Classification - researchr publication authors

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Peter J. Bevan, Amir Atapour Abarghouei. Skin Deep Unlearning: Artefact and Instrument Debiasing in the Context of Melanoma Classification. In Kamalika Chaudhuri, Stefanie Jegelka, Le Song, Csaba Szepesvári, Gang Niu 0001, Sivan Sabato, editors, International Conference on Machine Learning, ICML 2022, 17-23 July 2022, Baltimore, Maryland, USA. Volume 162 of Proceedings of Machine Learning Research, pages 1874-1892, PMLR, 2022. [doi]

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