Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems - researchr publication authors

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Abdellatif Bey-Temsamani, S. Kauffmann, Y. Descas, Bart Vandevelde, Franco Zanon, Geert Willems. Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems. Microelectronics Reliability, 76:42-46, 2017. [doi]

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