Resident Data Pattern Analysis Using Sector Clustering for Storage Drive Forensics

Nitesh K. Bharadwaj, Upasna Singh, Gaurav Gupta. Resident Data Pattern Analysis Using Sector Clustering for Storage Drive Forensics. In Gilbert L. Peterson, Sujeet Shenoi, editors, Advances in Digital Forensics XVI - 16th IFIP WG 11.9 International Conference, New Delhi, India, January 6-8, 2020, Revised Selected Papers. Volume 589 of IFIP Advances in Information and Communication Technology, pages 137-157, Springer, 2020. [doi]

@inproceedings{BharadwajSG20,
  title = {Resident Data Pattern Analysis Using Sector Clustering for Storage Drive Forensics},
  author = {Nitesh K. Bharadwaj and Upasna Singh and Gaurav Gupta},
  year = {2020},
  doi = {10.1007/978-3-030-56223-6_8},
  url = {https://doi.org/10.1007/978-3-030-56223-6_8},
  researchr = {https://researchr.org/publication/BharadwajSG20},
  cites = {0},
  citedby = {0},
  pages = {137-157},
  booktitle = {Advances in Digital Forensics XVI - 16th IFIP WG 11.9 International Conference, New Delhi, India, January 6-8, 2020, Revised Selected Papers},
  editor = {Gilbert L. Peterson and Sujeet Shenoi},
  volume = {589},
  series = {IFIP Advances in Information and Communication Technology},
  publisher = {Springer},
  isbn = {978-3-030-56223-6},
}