Outage probability analysis for α-μ/κ-μ and κ-μ/α-μ fading scenarios

Nidhi Bhargav, David E. Simmons, Carlos Rafael Nogueira da Silva, Elvio Joao Leonardo, Simon L. Cotton, Michel Daoud Yacoub. Outage probability analysis for α-μ/κ-μ and κ-μ/α-μ fading scenarios. In 28th IEEE Annual International Symposium on Personal, Indoor, and Mobile Radio Communications, PIMRC 2017, Montreal, QC, Canada, October 8-13, 2017. pages 1-5, IEEE, 2017. [doi]

@inproceedings{BhargavSSLCY17,
  title = {Outage probability analysis for α-μ/κ-μ and κ-μ/α-μ fading scenarios},
  author = {Nidhi Bhargav and David E. Simmons and Carlos Rafael Nogueira da Silva and Elvio Joao Leonardo and Simon L. Cotton and Michel Daoud Yacoub},
  year = {2017},
  doi = {10.1109/PIMRC.2017.8292529},
  url = {https://doi.org/10.1109/PIMRC.2017.8292529},
  researchr = {https://researchr.org/publication/BhargavSSLCY17},
  cites = {0},
  citedby = {0},
  pages = {1-5},
  booktitle = {28th IEEE Annual International Symposium on Personal, Indoor, and Mobile Radio Communications, PIMRC 2017, Montreal, QC, Canada, October 8-13, 2017},
  publisher = {IEEE},
  isbn = {978-1-5386-3531-5},
}