Sandeep Bhatt, William G. Horne, Prasad Rao. On Computing Enterprise IT Risk Metrics. In Jan Camenisch, Simone Fischer-Hübner, Yuko Murayama, Armand Portmann, Carlos Rieder, editors, Future Challenges in Security and Privacy for Academia and Industry - 26th IFIP TC 11 International Information Security Conference, SEC 2011, Lucerne, Switzerland, June 7-9, 2011. Proceedings. Volume 354 of IFIP Advances in Information and Communication Technology, pages 271-280, Springer, 2011. [doi]
@inproceedings{BhattHR11,
title = {On Computing Enterprise IT Risk Metrics},
author = {Sandeep Bhatt and William G. Horne and Prasad Rao},
year = {2011},
doi = {10.1007/978-3-642-21424-0_22},
url = {http://dx.doi.org/10.1007/978-3-642-21424-0_22},
researchr = {https://researchr.org/publication/BhattHR11},
cites = {0},
citedby = {0},
pages = {271-280},
booktitle = {Future Challenges in Security and Privacy for Academia and Industry - 26th IFIP TC 11 International Information Security Conference, SEC 2011, Lucerne, Switzerland, June 7-9, 2011. Proceedings},
editor = {Jan Camenisch and Simone Fischer-Hübner and Yuko Murayama and Armand Portmann and Carlos Rieder},
volume = {354},
series = {IFIP Advances in Information and Communication Technology},
publisher = {Springer},
isbn = {978-3-642-21423-3},
}