Shameek Bhattacharjee, Aditya V. Thakur, Sajal K. Das. Towards Fast and Semi-supervised Identification of Smart Meters Launching Data Falsification Attacks. In Jong Kim 0001, Gail-Joon Ahn, Seungjoo Kim, Yongdae Kim, Javier López 0001, Taesoo Kim, editors, Proceedings of the 2018 on Asia Conference on Computer and Communications Security, AsiaCCS 2018, Incheon, Republic of Korea, June 04-08, 2018. pages 173-185, ACM, 2018. [doi]
@inproceedings{BhattacharjeeTD18,
title = {Towards Fast and Semi-supervised Identification of Smart Meters Launching Data Falsification Attacks},
author = {Shameek Bhattacharjee and Aditya V. Thakur and Sajal K. Das},
year = {2018},
doi = {10.1145/3196494.3196551},
url = {http://doi.acm.org/10.1145/3196494.3196551},
researchr = {https://researchr.org/publication/BhattacharjeeTD18},
cites = {0},
citedby = {0},
pages = {173-185},
booktitle = {Proceedings of the 2018 on Asia Conference on Computer and Communications Security, AsiaCCS 2018, Incheon, Republic of Korea, June 04-08, 2018},
editor = {Jong Kim 0001 and Gail-Joon Ahn and Seungjoo Kim and Yongdae Kim and Javier López 0001 and Taesoo Kim},
publisher = {ACM},
}