Towards a Scalable Test Solution for the Analysis of Interconnect Shorts in On-chip Networks - researchr publication authors

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Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas. Towards a Scalable Test Solution for the Analysis of Interconnect Shorts in On-chip Networks. In 24th IEEE International Symposium on Modeling, Analysis and Simulation of Computer and Telecommunication Systems, MASCOTS 2016, London, United Kingdom, September 19-21, 2016. pages 394-399, IEEE Computer Society, 2016. [doi]

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