Reliability Monitoring in a Smart NoC Component - researchr publication authors

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Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas. Reliability Monitoring in a Smart NoC Component. In 27th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2020, Glasgow, Scotland, UK, November 23-25, 2020. pages 1-4, IEEE, 2020. [doi]

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