Jun Bi, Jianping Wu. An approach to concurrent TTCN test generation. J. Comput. Sci. Technol., 14(6):614-618, 1999. [doi]
@article{BiW99-0,
title = {An approach to concurrent TTCN test generation},
author = {Jun Bi and Jianping Wu},
year = {1999},
doi = {10.1007/BF02951883},
url = {http://dx.doi.org/10.1007/BF02951883},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/BiW99-0},
cites = {0},
citedby = {0},
journal = {J. Comput. Sci. Technol.},
volume = {14},
number = {6},
pages = {614-618},
}