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Sub-threshold behavior of long channel undoped cylindrical surrounding-gate MOSFETs

Wei Bian, Jin He, Lining Zhang, Jian Zhang 0002, Mansun Chan. Sub-threshold behavior of long channel undoped cylindrical surrounding-gate MOSFETs. Microelectronics Reliability, 49(8):897-903, 2009. [doi]

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Wei Bian

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Jin He

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Lining Zhang

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Jian Zhang 0002

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Mansun Chan

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