A Deep Learning Based Model for Driving Risk Assessment

Yiyang Bian, Chang-Heon Lee, J. Leon Zhao, Yibo Wan. A Deep Learning Based Model for Driving Risk Assessment. In Tung Bui, editor, 52nd Hawaii International Conference on System Sciences, HICSS 2019, Grand Wailea, Maui, Hawaii, USA, January 8-11, 2019. pages 1-10, ScholarSpace / AIS Electronic Library (AISeL), 2019. [doi]

Authors

Yiyang Bian

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Chang-Heon Lee

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J. Leon Zhao

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Yibo Wan

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