Song Bian, Michihiro Shintani, Zheng Wang 0020, Masayuki Hiromoto, Anupam Chattopadhyay, Takashi Sato. Runtime NBTI Mitigation for Processor Lifespan Extension via Selective Node Control. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 234-239, IEEE Computer Society, 2016. [doi]
@inproceedings{BianS0HCS16,
title = {Runtime NBTI Mitigation for Processor Lifespan Extension via Selective Node Control},
author = {Song Bian and Michihiro Shintani and Zheng Wang 0020 and Masayuki Hiromoto and Anupam Chattopadhyay and Takashi Sato},
year = {2016},
doi = {10.1109/ATS.2016.31},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.31},
researchr = {https://researchr.org/publication/BianS0HCS16},
cites = {0},
citedby = {0},
pages = {234-239},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}