Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation - researchr publication authors

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Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato. Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation. In Ayse Kivilcim Coskun, Martin Margala, Laleh Behjat, Jie Han, editors, Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016. pages 203-208, ACM, 2016. [doi]

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